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The procurement of the Supply, Installation and Commissioning of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with Gallium Ion Source

Key facts

Country
Denmark
Region
DK012
Estimated value
not stated
Procedure
open
Published
Bids due
Source
TED (EU tenders)

Description

DTU requires the supply, delivery, installation, commissioning and acceptance of one (1) focused ion beam scanning electron microscope (FIB-SEM) dual-beam platform. The instrument shall serve a multi-user research environment and will be used for high-resolution surface imaging, site-specific cross-sectioning, TEM lamella preparation (including automated workflows), 3D FIB-SEM tomography, gas-assisted deposition and etching, nanoscale manipulation, and elemental microanalysis by energy-dispersive X-ray spectroscopy (EDS) and ToF-SIMS.

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